Session K4-1: CMOS Digital Radiography

Prof. Youngcheol Chae, Yonsei University, Korea

K4-1: 9:00-9:45, Oct. 25, 2024, Friday

Title: CMOS Digital Radiography

Abstract:

Medical X-ray detectors such as computed tomography, radiography and dental X-ray are widely used in medical diagnostics. The market size of X-ray detector has also increased in recent years and the forecast is also very promising. The size of X-ray detectors must be the same size as the target, simply because the X-rays cannot be focused through a lens. The wafer-scale CMOS detector can be realized using the wafer-level stitching technique. Due to the volume-scale feasibility of the scintillator with CMOS pixels, CMOS X-ray detectors are not only cost-effective but also suitable for use in large detectors, thus dominating the X-ray imaging market. CMOS X-ray detectors used in medical devices should also provide full image depth for a given area of interest and require high resolution, low noise and wide dynamic range in a wafer-scale detector. Therefore, the CMOS X-ray detector poses significant challenges to the sensor and readout interfaces. It would be interesting to see how such challenges are adequately addressed in recent advances in wafer-scale CMOS X-ray detectors.

Biography:

Prof. Youngcheol Chae is currently a Professor in Electrical and Electronic Engineering at Yonsei University, Seoul, Korea. He received his Ph.D. degree from Yonsei University in 2009. During his Ph. D. studies, he advanced oversampling ADCs through innovative design techniques including inverter-based amplifiers, which have been adopted today for many low-power data converters. After joining Yonsei University in 2012, he led a Yonsei Mixed-Signal IC group, focusing on innovative analog and mixed-signal circuits and systems for communication, sensing, and biomedical applications. This has resulted in 130+ peer-reviewed journal and conference papers and holds 50+ patents. Especially, his research team reported 60+ State-of-The-Art Chips in JSSC, ISSCC, and Symposium on VLSI Circuits. Dr. Chae has been serving as a TPC member of the International Solid-State Circuits Conference (ISSCC), Asian Solid-State Circuits Conference (A-SSCC), and Custom Integrated Circuits Conference (CICC). He received the ISSCC 2021 Takuo Sugano Award for Outstanding Far-East Paper, the Best Young Professor Award in Engineering from Yonsei University in 2018, the Haedong Young Engineer Award from the Institute of Electronics and Information Engineers (IEIE) Korea in 2017, the ISSCC Silkroad Award in 2017, the Outstanding Research Award of Yonsei University (2017, 2019, and 2020), and the Outstanding Teaching Awards of Yonsei University (2013, 2014). He was a guest editor of the Journal of Solid-State Circuits (JSSC) and a distinguished lecturer (DL) of IEEE Solid-State Circuits Society (SSCS).